PROCESSOR TESTABILITY AND DESIGN CONSEQUENCES

被引：0
|
作者：
ROBACH, C
SAUCIER, G
LEBRUN, J
机构：
[1] UNIV GRENOBLE, ENSIMAG, GRENOBLE, FRANCE
[2] CII, LES CLAYES SOUS BOIS, FRANCE
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1976年 / 25卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：645 / 652
页数：8
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