PROCESSOR TESTABILITY AND DESIGN CONSEQUENCES

被引：0
|
作者：
ROBACH, C
SAUCIER, G
LEBRUN, J
机构：
[1] UNIV GRENOBLE, ENSIMAG, GRENOBLE, FRANCE
[2] CII, LES CLAYES SOUS BOIS, FRANCE
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1976年 / 25卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：645 / 652
页数：8
相关论文
共 50 条
  • [21] Design for testability: Today and in the future
    Williams, TW
    [J]. TENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 1997, : 314 - 315
  • [22] Design for testability of FPGA blocks
    McCracken, S
    Zilic, Z
    [J]. ISQED 2004: 5TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, PROCEEDINGS, 2004, : 86 - 91
  • [23] Design for testability - Case study
    [J]. 1600, Japan Institute of Electronics Packaging (16):
  • [24] Design for testability of BiCMOS inverters
    叶波
    郑增钰
    [J]. Science Bulletin, 1995, (12) : 1052 - 1054
  • [25] DESIGN FOR TESTABILITY OF BICMOS INVERTERS
    YE, B
    ZHENG, ZY
    [J]. CHINESE SCIENCE BULLETIN, 1995, 40 (12): : 1052 - 1054
  • [26] Specification transformations and design for testability
    Karoui, K
    Dssouli, R
    Cherkaoui, O
    [J]. IEEE GLOBECOM 1996 - CONFERENCE RECORD, VOLS 1-3: COMMUNICATIONS: THE KEY TO GLOBAL PROSPERITY, 1996, : 680 - 685
  • [27] IEEE DESIGN FOR TESTABILITY WORKSHOP
    WILLIAMS, TW
    [J]. IEEE DESIGN & TEST OF COMPUTERS, 1985, 2 (04): : 90 - 91
  • [28] Testability design prevents harm
    Ungar, Louis Y.
    [J]. IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE, 2010, 25 (03) : 35 - 43
  • [29] Security in Design for Testability (DFT)
    Pandey, Rahul
    Pandey, Sakshee
    Hammed, C. S. Mohammed Shaul
    [J]. 2017 IEEE INTERNATIONAL CONFERENCE ON COMPUTATIONAL INTELLIGENCE AND COMPUTING RESEARCH (ICCIC), 2017, : 442 - 445
  • [30] The design for testability of Longtium microprocessor
    Wang Danghui
    Gao Deyuan
    Zhang Shengbing
    [J]. ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS, 2007, : 103 - 106
12345