A UNIVERSAL TEST SET FOR CMOS CIRCUITS

被引：7
|
作者：
GUPTA, G [1 ]
JHA, NK [1 ]
机构：
[1] PRINCETON UNIV,DEPT ELECT ENGN,PRINCETON,NJ 08544
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1988年 / 7卷 / 05期
关键词：
D O I：
10.1109/43.3197
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
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页码：590 / 597
页数：8
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