EXCESS NOISE IN SELECTED FIELD-EFFECT TRANSISTORS

被引：12
|
作者：
LLACER, J [1 ]
MEIER, DF [1 ]
机构：
[1] UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DEPT ELECTR ENGN, BERKELEY, CA 94720 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1977年 / 24卷 / 01期
关键词：
D O I：
10.1109/TNS.1977.4328696
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：317 / 326
页数：10
相关论文
共 50 条
  • [41] TRANSFER-IMPEDANCE METHOD FOR NOISE IN FIELD-EFFECT TRANSISTORS
    VANVLIET, KM
    SOLID-STATE ELECTRONICS, 1979, 22 (03) : 233 - 236
  • [42] 1/F NOISE MEASUREMENTS ON HGCDTE FIELD-EFFECT TRANSISTORS
    CELIKBUTLER, Z
    ALAMGIR, SM
    BORRELLO, SR
    SOLID-STATE ELECTRONICS, 1990, 33 (05) : 585 - 590
  • [43] Noise Spectroscopy of Traps in Silicon Nanowire Field-Effect Transistors
    Pud, S.
    Li, J.
    Petrychuk, M.
    Feste, S.
    Offenhaeusser, A.
    Mantl, S.
    Vitusevich, S.
    2011 21ST INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF), 2011, : 242 - 245
  • [44] EXPERIMENTAL STUDY OF FLICKER NOISE IN MIS FIELD-EFFECT TRANSISTORS
    MANTENA, NR
    LUCAS, RC
    ELECTRONICS LETTERS, 1969, 5 (24) : 607 - &
  • [45] LOW-FREQUENCY NOISE IN JUNCTION FIELD-EFFECT TRANSISTORS
    KANDIAH, K
    WHITING, FB
    SOLID-STATE ELECTRONICS, 1978, 21 (08) : 1079 - 1088
  • [46] Enhanced shot noise in carbon nanotube field-effect transistors
    Betti, A.
    Fiori, G.
    Iannaccone, G.
    APPLIED PHYSICS LETTERS, 2009, 95 (25)
  • [47] Physics of noise in quantum-confined field-effect transistors
    Green, F
    Chivers, MJ
    PHYSICAL REVIEW B, 1996, 54 (08): : 5791 - 5800
  • [48] EXCESS GATE-LEAKAGE CURRENT OF INGAAS JUNCTION FIELD-EFFECT TRANSISTORS
    OHNAKA, K
    SHIBATA, J
    JOURNAL OF APPLIED PHYSICS, 1988, 63 (09) : 4714 - 4717
  • [49] Effect of induced gate noise at zero drain bias in field-effect transistors
    Jindal, RP
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (03) : 432 - 434
  • [50] Low-Frequency Noise Characteristics of Ferroelectric Field-Effect Transistors
    Phadke, Omkar
    Aabrar, Khandker Akif
    Luo, Yuan-chun
    Kirtania, Sharadindu Gopal
    Khan, Asif Islam
    Datta, Suman
    Yu, Shimeng
    2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS, 2023,
12345