共 50 条
- [33] INFLUENCE OF SURFACE ELECTRIC-FIELD ON THE MOS CAPACITANCE OF NORMAL-CHANNEL INVERSION-LAYERS IN SMALL GAP SEMICONDUCTORS PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 59 (01): : K69 - K74
- [34] Transient capacitance in metal-oxide-semiconductor structures with stacked gate dielectrics JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2004, 43 (11B): : 7826 - 7830
- [35] Transient capacitance in metal-oxide-semiconductor structures with stacked gate dielectrics Goto, M., 1600, Japan Society of Applied Physics (43):
- [38] Novel implantation method to improve machine-model electrostatic discharge robustness of stacked N-channel metal-oxide semiconductors (NMOS) in sub-quarter-micron complementary metal-oxide semiconductors (CMOS) technology JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2002, 41 (11B): : L1288 - L1290
- [40] Novel implantation method to improve machine-model electrostatic discharge robustness of stacked N-channel metal-oxide semiconductors (NMOS) in sub-quarter-micron complementary metal-oxide semiconductors (CMOS) technology Ker, M.-D. (mdker@ieee.org), 1600, Japan Society of Applied Physics (41):