TEST PATTERN GENERATION FOR API FAULTS IN RAM

被引：0
|
作者：
SALUJA, KK [1 ]
KINOSHITA, K [1 ]
机构：
[1] HIROSHIMA UNIV,FAC INTEGRATED ARTS & SCI,DEPT INFORMAT & BEHAV SCI,HIROSHIMA 730,JAPAN
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1985年 / 34卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：284 / 287
页数：4
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