TEST PATTERN GENERATION FOR API FAULTS IN RAM

被引：0

作者：

SALUJA, KK ^{[1
]}

KINOSHITA, K ^{[1
]}

机构：

[1] HIROSHIMA UNIV,FAC INTEGRATED ARTS & SCI,DEPT INFORMAT & BEHAV SCI,HIROSHIMA 730,JAPAN

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1985年 / 34卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：284 / 287

页数：4

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