Automatic test pattern generation for IDDQ faults based upon symbolic simulation

被引：0
|
作者：
RibasXirgo, L [1 ]
CarrabinaBordoll, J [1 ]
机构：
[1] UNIV AUTONOMA BARCELONA,DEPT COMP SCI,MICROELECT GRP,BELLATERRA 08193,SPAIN
来源：
1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS | 1996年
关键词：
D O I：
10.1109/IDDQ.1996.557840
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：94 / 98
页数：5
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