TEST PATTERN GENERATION FOR SEQUENTIAL MOS CIRCUITS BY SYMBOLIC FAULT SIMULATION

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作者：
CHO, K
BRYANT, RE
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26TH ACM/IEEE DESIGN AUTOMATION CONFERENCE | 1989年
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：418 / 423
页数：6
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