EFFECTS OF INTERFACIAL MICROSTRUCTURE ON UNIFORMITY AND THERMAL-STABILITY OF AUNIGE OHMIC CONTACT TO N-TYPE GAAS

被引：130
|
作者：
SHIH, YC
MURAKAMI, M
WILKIE, EL
CALLEGARI, AC
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 02期
关键词：
D O I：
10.1063/1.339860
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：582 / 590
页数：9
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