TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF THE MICROSTRUCTURE OF AUNIGE OHMIC CONTACT TO N-TYPE GAAS

被引：1
|
作者：
SHIH, YC
WILKIE, EL
MURAKAMI, M
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词：
D O I：
10.1116/1.574585
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：1485 / 1486
页数：2
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