Efficient Path Selection for Delay Testing Based on Path Clustering

被引：0

作者：

Seiichiro Tani

Mitsuo Teramoto

Tomoo Fukazawa

Kazuyoshi Matsuhiro

机构：

[1] NTT Network Innovation Laboratories,

来源：

Journal of Electronic Testing | 1999年 / 15卷

关键词：

delay testing; path delay; delay fault; clustering;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

In this paper, we introduce a way of modeling the differences between the calculated delays and the real delays, and propose an efficient path selection method for path delay testing based on the model. Path selection is done by judging which of two paths has the larger real delay by taking into account the ambiguity of calculated delay, caused by imprecise delay modeling as well as process disturbances. In order to make precise judgment under this ambiguity, the delays of only the unshared segments of the two paths are evaluated. This is because the shared segments are presumed to have the same real delays on both paths.

引用

页码：75 / 85

页数：10

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