Enhancing Performance of Dual-Gate FinFET with High-K Gate Dielectric Materials in 5 nm Technology: A Simulation Study

被引:0
|
作者
M. V. Ganeswara Rao
N. Ramanjaneyulu
Balamurali Pydi
Umamaheshwar Soma
K. Rajesh Babu
Satti Harichandra Prasad
机构
[1] Shri Vishnu Engineering College for Women,Department of ECE
[2] RGMCET,Department of Electronics and Communication Engineering
[3] Electrical and Electronics Engineering in Aditya Institute of Technology and Management,Department of Electronics and Engineering
[4] Kakatiya Institute of Technology and Science,undefined
[5] Koneru Lakshmaiah Education Foundation,undefined
[6] Aditya Engineering College,undefined
关键词
High-; gate dielectrics; Electrical behavior; Hafnium oxide; Transconductance; Early voltage;
D O I
暂无
中图分类号
学科分类号
摘要
The rapid advancement in nanoscale devices demands innovative gate dielectric materials to replace traditional Silicon dioxide. This paper investigates the electrical behavior and performance of a dual-gate FinFET employing different high-K gate dielectric materials (Silicon dioxide, Hafnium oxide, Titanium oxide) through ATLAS 2D simulation in 5 nm technology. We analyze how these high-K gate dielectric materials influence the device, focusing on performance enhancement. The study highlights various key performance parameters (ION\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{ON}$$\end{document}, IOFF\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{OFF}$$\end{document}, gm\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{m}$$\end{document}, gds\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{ds}$$\end{document}, RON\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$R_{ON}$$\end{document}, TF, EV, VIL\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IL}$$\end{document}, VIH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IH}$$\end{document}, NML\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{L}$$\end{document}, NMH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{H}$$\end{document}) and reveals a significant performance improvement with HfO2\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\textrm{HfO}_2$$\end{document} dielectric material in the proposed Dual-Gate FinFET. Achieving impressive performance parameters (ION\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{ON}$$\end{document}: 21.59 mA, IOFF\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{OFF}$$\end{document}: 21 μ\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\mu$$\end{document}A, Maximum net Electric field: 1221290 V/cm, gm(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{m(max)}$$\end{document}: 0.05187 S, gds(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{ds(max)}$$\end{document}: 0.03462 S, RON(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$R_{ON(max)}$$\end{document}: 25.93 kΩ\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\Omega$$\end{document}, TFmax: 5.02, Gainmax\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$Gain_{max}$$\end{document}: 90.233, EVmax\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$EV_{max}$$\end{document}: 67.532 V, VIL\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IL}$$\end{document}: 0.21 V, VIH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IH}$$\end{document}: 0.4 V, NML\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{L}$$\end{document}: 198 V, NMH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{H}$$\end{document}: 600 V), this paper provides valuable insights for designing high-performance devices with HfO2\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\textrm{HfO}_2$$\end{document} dielectric material.
引用
收藏
页码:557 / 569
页数:12
相关论文
共 50 条
  • [41] Impact of Temperature on the Performance of Sub-35nm Symmetrie Double Gate Junctionless Transistor Based Inverter using High-K Gate Dielectric, a TCAD Simulation Study
    Boro, Uttam Ch.
    Bora, Nipanka
    Pegu, Pankaj Appun
    Subadar, Rupaban
    PROCEEDINGS OF THE FIRST IEEE INTERNATIONAL CONFERENCE ON POWER ELECTRONICS, INTELLIGENT CONTROL AND ENERGY SYSTEMS (ICPEICES 2016), 2016,
  • [42] High performance FDSOI CMOS technology with metal gate and high-k
    Doris, B. (dorisb@us.ibm.com), 2005, (Institute of Electrical and Electronics Engineers Inc.):
  • [43] Simulation of Dual-Gate SOI MOSFET with Different Dielectric layers
    Yadav, Jyoti
    Chaudhary, R.
    Mukhiya, R.
    Sharma, R.
    Khanna, V. K.
    2ND INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES: MICRO TO NANO 2015 (ETMN-2015), 2016, 1724
  • [44] High performance FDSOI CMOS technology with metal gate and high-k
    Doris, B
    Kim, YH
    Linder, BP
    Steen, M
    Narayanan, V
    Boyd, D
    Rubino, J
    Chang, L
    Sleight, J
    Topol, A
    Sikorski, E
    Shi, L
    Wong, K
    Babich, K
    Zhang, Y
    Kirsch, P
    Newbury, J
    Walker, GF
    Carruthers, R
    D'Emic, C
    Kozlowski, P
    Jammy, R
    Guarini, KW
    Leong, M
    2005 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2005, : 214 - 215
  • [45] A Systematic Study of Gate Dielectric TDDB in FinFET Technology
    Kim, Hyunjin
    Jin, Minjung
    Sagong, Hyunchul
    Kim, Jinju
    Jung, Ukjin
    Choi, Minhyuck
    Park, Junekyun
    Shin, Sangchul
    Pae, Sangwoo
    2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2018,
  • [46] Analytical modeling and simulation of workfunction engineered gate junctionless high-k dielectric Double Gate MOSFET: A comparative study
    Dept. of Electronics and Telecommunication Engineering, Jadavpur University, India
    IET Conf Publ, CP683 (428-432):
  • [48] The Effect of Gate Stack and High-K Spacer on Device Performance of a Junctionless GAA FinFET
    Kumar, Bhavya
    Kumar, Ajay
    Chaujar, Rishu
    PROCEEDINGS OF 2ND INTERNATIONAL CONFERENCE ON VLSI DEVICE, CIRCUIT AND SYSTEM (IEEE VLSI DCS 2020), 2020, : 159 - 163
  • [49] High performance 70 nm gate length germanium-on-insulator pMOSFET with high-k/metal gate
    Romanjek, K.
    Hutin, L.
    Le Royer, C.
    Pouydebasque, A.
    Jaud, M. -A.
    Tabone, C.
    Augendre, E.
    Sanchez, L.
    Hartmann, J. -M.
    Grampeix, H.
    Mazzocchi, V.
    Soliveres, S.
    Truche, R.
    Clavelier, L.
    Scheiblin, P.
    Garros, X.
    Reimbold, G.
    Vinet, M.
    Boulanger, F.
    Deleonibus, S.
    SOLID-STATE ELECTRONICS, 2009, 53 (07) : 723 - 729
  • [50] High Sensitivity Dual-Gate Four-Terminal Magnetic Sensor Compatible With SOI FinFET Technology
    Jankovic, Nebojsa
    Kryvchenkova, Olga
    Batcup, Steve
    Igic, Petar
    IEEE ELECTRON DEVICE LETTERS, 2017, 38 (06) : 810 - 813