Enhancing Performance of Dual-Gate FinFET with High-K Gate Dielectric Materials in 5 nm Technology: A Simulation Study

被引:0
|
作者
M. V. Ganeswara Rao
N. Ramanjaneyulu
Balamurali Pydi
Umamaheshwar Soma
K. Rajesh Babu
Satti Harichandra Prasad
机构
[1] Shri Vishnu Engineering College for Women,Department of ECE
[2] RGMCET,Department of Electronics and Communication Engineering
[3] Electrical and Electronics Engineering in Aditya Institute of Technology and Management,Department of Electronics and Engineering
[4] Kakatiya Institute of Technology and Science,undefined
[5] Koneru Lakshmaiah Education Foundation,undefined
[6] Aditya Engineering College,undefined
关键词
High-; gate dielectrics; Electrical behavior; Hafnium oxide; Transconductance; Early voltage;
D O I
暂无
中图分类号
学科分类号
摘要
The rapid advancement in nanoscale devices demands innovative gate dielectric materials to replace traditional Silicon dioxide. This paper investigates the electrical behavior and performance of a dual-gate FinFET employing different high-K gate dielectric materials (Silicon dioxide, Hafnium oxide, Titanium oxide) through ATLAS 2D simulation in 5 nm technology. We analyze how these high-K gate dielectric materials influence the device, focusing on performance enhancement. The study highlights various key performance parameters (ION\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{ON}$$\end{document}, IOFF\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{OFF}$$\end{document}, gm\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{m}$$\end{document}, gds\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{ds}$$\end{document}, RON\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$R_{ON}$$\end{document}, TF, EV, VIL\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IL}$$\end{document}, VIH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IH}$$\end{document}, NML\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{L}$$\end{document}, NMH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{H}$$\end{document}) and reveals a significant performance improvement with HfO2\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\textrm{HfO}_2$$\end{document} dielectric material in the proposed Dual-Gate FinFET. Achieving impressive performance parameters (ION\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{ON}$$\end{document}: 21.59 mA, IOFF\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{OFF}$$\end{document}: 21 μ\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\mu$$\end{document}A, Maximum net Electric field: 1221290 V/cm, gm(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{m(max)}$$\end{document}: 0.05187 S, gds(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{ds(max)}$$\end{document}: 0.03462 S, RON(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$R_{ON(max)}$$\end{document}: 25.93 kΩ\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\Omega$$\end{document}, TFmax: 5.02, Gainmax\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$Gain_{max}$$\end{document}: 90.233, EVmax\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$EV_{max}$$\end{document}: 67.532 V, VIL\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IL}$$\end{document}: 0.21 V, VIH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IH}$$\end{document}: 0.4 V, NML\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{L}$$\end{document}: 198 V, NMH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{H}$$\end{document}: 600 V), this paper provides valuable insights for designing high-performance devices with HfO2\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\textrm{HfO}_2$$\end{document} dielectric material.
引用
收藏
页码:557 / 569
页数:12
相关论文
共 50 条
  • [21] Effects of High-k Dielectric Materials on Electrical Performance of Double Gate and Gate-All-Around MOSFET
    Kosmani, Nor Fareza
    Hamid, Fatimah A.
    Razali, M. Anas
    INTERNATIONAL JOURNAL OF INTEGRATED ENGINEERING, 2020, 12 (02): : 81 - 88
  • [22] Technology Scaling on High-K & Metal-Gate FinFET BTI Reliability
    Lee, Kyong Taek
    Kang, Wonchang
    Chung, Eun-Ae
    Kim, Gunrae
    Shim, Hyewon
    Lee, Hyunwoo
    Kim, Hyejin
    Choe, Minhyeok
    Lee, Nae-In
    Patel, Anuj
    Park, Junekyun
    Park, Jongwoo
    2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2013,
  • [23] The Impact of Interface Quality on High-K Gate Dielectric Devices for 32 nm Technology and beyond
    Tseng, Hsing-Huang
    2008 9TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, VOLS 1-4, 2008, : 1237 - 1240
  • [24] Study of SiGe selective epitaxial process integration with high-k and metal gate for 16/14 nm nodes FinFET technology
    Wang, Guilei
    Qin, Changliang
    Yin, Huaxiang
    Luo, Jun
    Duan, Ningyuan
    Yang, Ping
    Gao, Xingyu
    Yang, Tao
    Li, Junfeng
    Yan, Jiang
    Zhu, Huilong
    Wang, Wenwu
    Chen, Dapeng
    Ye, Tianchun
    Zhao, Chao
    Radamson, Henry H.
    MICROELECTRONIC ENGINEERING, 2016, 163 : 49 - 54
  • [25] On the Suitability of a High-k Gate Dielectric in Nanoscale FinFET CMOS Technology (vol 55, pg 1714, 2008)
    Agrawal, S.
    Fossum, J. G.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2009, 56 (12) : 3245 - 3245
  • [26] Key aspects affecting the performances of high-K dielectrics based single-gate and dual-gate OTFTs
    Gupta, Srishti
    Singh, Manish Kumar
    MATERIALS TODAY-PROCEEDINGS, 2022, 50 : 231 - 237
  • [27] 3-D Simulation of Novel High Performance of Nano-Scale Dual Gate Fin-FET Inserting the High-K Dielectric TiO2 at 5 Nm Technology
    N. Bourahla
    B. Hadri
    A. Bourahla
    Silicon, 2020, 12 : 1301 - 1309
  • [28] 3-D Simulation of Novel High Performance of Nano-Scale Dual Gate Fin-FET Inserting the High-K Dielectric TiO2 at 5 Nm Technology
    Bourahla, N.
    Hadri, B.
    Bourahla, A.
    SILICON, 2020, 12 (06) : 1301 - 1309
  • [29] High-performance dual-gate carbon nanotube FETs with 40-nm gate length
    Lin, YM
    Appenzeller, J
    Chen, ZH
    Chen, ZG
    Cheng, HM
    Avouris, P
    IEEE ELECTRON DEVICE LETTERS, 2005, 26 (11) : 823 - 825
  • [30] High Performance 22/20nm FinFET CMOS Devices with Advanced High-K/Metal Gate Scheme
    Wu, C. C.
    Lin, D. W.
    Keshavarzi, A.
    Huang, C. H.
    Chan, C. T.
    Tseng, C. H.
    Chen, C. L.
    Hsieh, C. Y.
    Wong, K. Y.
    Cheng, M. L.
    Li, T. H.
    Lin, Y. C.
    Yang, L. Y.
    Lin, C. P.
    Hou, C. S.
    Lin, H. C.
    Yang, J. L.
    Yu, K. F.
    Chen, M. J.
    Hsieh, T. H.
    Peng, Y. C.
    Chou, C. H.
    Lee, C. J.
    Huang, C. W.
    Lu, C. Y.
    Yang, F. K.
    Chen, H. K.
    Weng, L. W.
    Yen, P. C.
    Wang, S. H.
    Chang, S. W.
    Chuang, S. W.
    Gan, T. C.
    Wu, T. L.
    Lee, T. Y.
    Huang, W. S.
    Huang, Y. J.
    Tseng, Y. W.
    Wu, C. M.
    Ou-Yang, Eric
    Hsu, K. Y.
    Lin, L. T.
    Wang, S. B.
    Kwok, T. M.
    Su, C. C.
    Tsai, C. H.
    Huang, M. J.
    Lin, H. M.
    Chang, A. S.
    Liao, S. H.
    2010 INTERNATIONAL ELECTRON DEVICES MEETING - TECHNICAL DIGEST, 2010,