Enhancing Performance of Dual-Gate FinFET with High-K Gate Dielectric Materials in 5 nm Technology: A Simulation Study

被引:0
|
作者
M. V. Ganeswara Rao
N. Ramanjaneyulu
Balamurali Pydi
Umamaheshwar Soma
K. Rajesh Babu
Satti Harichandra Prasad
机构
[1] Shri Vishnu Engineering College for Women,Department of ECE
[2] RGMCET,Department of Electronics and Communication Engineering
[3] Electrical and Electronics Engineering in Aditya Institute of Technology and Management,Department of Electronics and Engineering
[4] Kakatiya Institute of Technology and Science,undefined
[5] Koneru Lakshmaiah Education Foundation,undefined
[6] Aditya Engineering College,undefined
关键词
High-; gate dielectrics; Electrical behavior; Hafnium oxide; Transconductance; Early voltage;
D O I
暂无
中图分类号
学科分类号
摘要
The rapid advancement in nanoscale devices demands innovative gate dielectric materials to replace traditional Silicon dioxide. This paper investigates the electrical behavior and performance of a dual-gate FinFET employing different high-K gate dielectric materials (Silicon dioxide, Hafnium oxide, Titanium oxide) through ATLAS 2D simulation in 5 nm technology. We analyze how these high-K gate dielectric materials influence the device, focusing on performance enhancement. The study highlights various key performance parameters (ION\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{ON}$$\end{document}, IOFF\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{OFF}$$\end{document}, gm\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{m}$$\end{document}, gds\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{ds}$$\end{document}, RON\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$R_{ON}$$\end{document}, TF, EV, VIL\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IL}$$\end{document}, VIH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IH}$$\end{document}, NML\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{L}$$\end{document}, NMH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{H}$$\end{document}) and reveals a significant performance improvement with HfO2\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\textrm{HfO}_2$$\end{document} dielectric material in the proposed Dual-Gate FinFET. Achieving impressive performance parameters (ION\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{ON}$$\end{document}: 21.59 mA, IOFF\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$I_{OFF}$$\end{document}: 21 μ\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\mu$$\end{document}A, Maximum net Electric field: 1221290 V/cm, gm(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{m(max)}$$\end{document}: 0.05187 S, gds(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$g_{ds(max)}$$\end{document}: 0.03462 S, RON(max)\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$R_{ON(max)}$$\end{document}: 25.93 kΩ\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\Omega$$\end{document}, TFmax: 5.02, Gainmax\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$Gain_{max}$$\end{document}: 90.233, EVmax\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$EV_{max}$$\end{document}: 67.532 V, VIL\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IL}$$\end{document}: 0.21 V, VIH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$V_{IH}$$\end{document}: 0.4 V, NML\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{L}$$\end{document}: 198 V, NMH\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$NM_{H}$$\end{document}: 600 V), this paper provides valuable insights for designing high-performance devices with HfO2\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\textrm{HfO}_2$$\end{document} dielectric material.
引用
收藏
页码:557 / 569
页数:12
相关论文
共 50 条
  • [1] Enhancing Performance of Dual-Gate FinFET with High-K Gate Dielectric Materials in 5 nm Technology: A Simulation Study
    Rao, M. V. Ganeswara
    Ramanjaneyulu, N.
    Pydi, Balamurali
    Soma, Umamaheshwar
    Babu, K. Rajesh
    Prasad, Satti Harichandra
    TRANSACTIONS ON ELECTRICAL AND ELECTRONIC MATERIALS, 2023, 24 (06) : 557 - 569
  • [2] Simulation and Drain Current Performance analysis of High-K Gate Dielectric FinFET
    M. Aditya
    K. Srinivasa Rao
    K. Girija Sravani
    Koushik Guha
    Silicon, 2022, 14 : 4075 - 4078
  • [3] Simulation and Drain Current Performance analysis of High-K Gate Dielectric FinFET
    Aditya, M.
    Rao, K. Srinivasa
    Sravani, K. Girija
    Guha, Koushik
    SILICON, 2022, 14 (08) : 4075 - 4078
  • [4] Impact of High-K Gate Dielectric Materials on Uniformly Doped Dual Gate FinFET for Analog and Digital Applications
    Aditya, M.
    Rao, K. Srinivasa
    SILICON, 2022, 14 (16) : 10623 - 10635
  • [5] Impact of High-K Gate Dielectric Materials on Uniformly Doped Dual Gate FinFET for Analog and Digital Applications
    M. Aditya
    K. Srinivasa Rao
    Silicon, 2022, 14 : 10623 - 10635
  • [6] On the suitability of a high-k gate dielectric in nanoscale FinFET CMOS technology
    Agrawal, Shishir
    Fossum, Jerry G.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (07) : 1714 - 1719
  • [7] Simulation of electrical characteristics and structural optimization for small-scaled dual-gate GeOI MOSFET with high-k gate dielectric
    Bai Yurong
    Xu Jingping
    Liu Lu
    Fan Minmin
    JOURNAL OF SEMICONDUCTORS, 2014, 35 (09)
  • [8] Simulation of electrical characteristics and structural optimization for small-scaled dual-gate GeOI MOSFET with high-k gate dielectric
    白玉蓉
    徐静平
    刘璐
    范敏敏
    Journal of Semiconductors, 2014, 35 (09) : 43 - 48
  • [9] Optimization of Dual-K Gate Dielectric and Dual Gate Heterojunction SOI FinFET at 14 nm Gate Length
    Aujla, Samjot Kaur
    Kaur, Navneet
    IETE JOURNAL OF RESEARCH, 2022, 68 (01) : 658 - 666
  • [10] Development of high-k gate dielectric materials
    Wu De-Qi
    Zhao Hong-Sheng
    Yao Jin-Cheng
    Zhang Dong-Yan
    Chang Ai-Min
    JOURNAL OF INORGANIC MATERIALS, 2008, 23 (05) : 865 - 871