A Design of Linearity Built-in Self-Test for Current-Steering DAC

被引：0
|
作者：
Hsin-Wen Ting
Soon-Jyh Chang
Su-Ling Huang
机构：
[1] National Kaohsiung University of Applied Science,Department of Electronic Engineering
[2] National Cheng-Kung University,Department of Electrical Engineering
[3] Motech Industries,undefined
[4] Inc. (Motech),undefined
来源：
Journal of Electronic Testing | 2011年 / 27卷
关键词：
Built-in self-test (BIST); Digital-to-analog converters (DACs); Non-linearity errors; Selected-code method;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
In this paper, a current-mode Built-In Self-Test (BIST) scheme is proposed for on-chip estimating static non-linearity errors in current-steering digital-to-analog converters (DACs). The proposed DAC BIST scheme is designed to verify a 10-bit segmented current-steering DAC, consist of a 5-bit coarse DAC and a 5-bit fine one. This proposed BIST scheme includes a current-mode sample-and-difference circuit to increase the sampling current accuracy and control a current-controlled oscillator (ICO). In addition, only 36 measurements are required by using the selected-code method rather than 1024 measurements for the conventionally-utilized all-code method. Compared to the conventionally-utilized all-code method, about 85-% reduction of test time can be achieved.
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页码：85 / 94
页数：9
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