REALISTIC BUILT-IN SELF-TEST FOR STATIC RAMS

被引：14
|
作者：
DEKKER, R [1 ]
BEENKER, F [1 ]
THIJSSEN, L [1 ]
机构：
[1] DELFT UNIV TECHNOL,DEPT ELECT ENGN,DELFT,NETHERLANDS
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1989年 / 6卷 / 01期
关键词：
D O I：
10.1109/54.20387
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：26 / 34
页数：9
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