Dynamic performance of 6.5 kV SiC MOSFET body diodes and anti-parallel Schottky barrier diodes

被引:0
|
作者
Yujie Du
Xinling Tang
Xiaoguang Wei
Shuai Sun
Fei Yang
Zhibin Zhao
机构
[1] Beijing Institute of Smart Energy,State Key Laboratory of Advanced Power Transmission Technology
[2] North China Electric Power University,undefined
来源
关键词
6.5 kV SiC MOSFET; Body diode; Schottky barrier diode; Dynamic performance;
D O I
暂无
中图分类号
学科分类号
摘要
For a silicon carbide (SiC) metal–oxide–semiconductor field-effect transistor (MOSFET), both the body diode of the MOSFET and an anti-parallel diode can function as a freewheeling diode that carries reverse current. Selecting a suitable freewheeling method is particularly important to fully exploit the performance of high-voltage SiC MOSFET devices. In this study, based on the 6.5 kV SiC MOSFET and the Schottky barrier diode (SBD) developed by our research group, the dynamic characteristics of the MOSFET body diode, the SBD, and the parallel connection of the two are investigated. In addition, the influence of capacitive current on the dynamic characteristics is analyzed by establishing an equivalent circuit model. Test results show that when compared with the body diode, the SBD has an extremely low reverse recovery current, a lower capacitive current, and better reverse recovery temperature stability. Thus, the SBD is regarded as the most suitable freewheeling diode for the 6.5 kV SiC MOSFET. Finally, a package solution for the 6.5 kV SiC MOSFET and SBD is proposed.
引用
收藏
页码:1028 / 1040
页数:12
相关论文
共 50 条
  • [21] Switching Performance Comparison of 1200 V and 1700 V SiC Optimized Half Bridge Power Modules with SiC Antiparallel Schottky Diodes versus MOSFET Intrinsic Body Diodes
    Martin, Daniel
    Curbow, W. Austin
    Sparkman, Brett
    Kegley, Lauren E.
    McNutt, Ty
    2017 THIRTY SECOND ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC), 2017, : 2297 - 2304
  • [22] Demonstration of the first 10-kV 4H-SiC Schottky barrier diodes
    Zhao, JH
    Alexandrov, P
    Li, X
    IEEE ELECTRON DEVICE LETTERS, 2003, 24 (06) : 402 - 404
  • [23] ANTI-PARALLEL PAIR OF HIGH-EFFICIENCY AVALANCHE DIODES
    KAWAMOTO, H
    LIU, SG
    PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1971, 59 (03): : 427 - &
  • [24] Modeling and Evaluation of Stacking Fault Expansion Velocity in Body Diodes of 3.3 kV SiC MOSFET
    Kumiko Konishi
    Ryusei Fujita
    Akio Shima
    Journal of Electronic Materials, 2019, 48 : 1704 - 1713
  • [25] Performance Comparison of SiC Schottky Diodes and Silicon Ultra Fast Recovery Diodes
    Adamowicz, Marek
    Giziewski, Sebastian
    Pietryka, Jedrzej
    Krzeminski, Zbigniew
    2011 7TH INTERNATIONAL CONFERENCE-WORKSHOP COMPATIBILITY AND POWER ELECTRONICS (CPE), 2011, : 144 - 149
  • [26] Fully vertical AlN-on-SiC Schottky barrier diodes
    Okumura, Hironori
    Imura, Masataka
    Miyazawa, Fuga
    Mainini, Lorenzo
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2024, 63 (10)
  • [27] Junction barrier Schottky diodes in 6H SiC
    Zetterling, CM
    Dahlquist, F
    Lundberg, N
    Ostling, M
    Rottner, K
    Ramberg, L
    SOLID-STATE ELECTRONICS, 1998, 42 (09) : 1757 - 1759
  • [28] SCHOTTKY-BARRIER DIODES ON 3C-SIC
    YOSHIDA, S
    SASAKI, K
    SAKUMA, E
    MISAWA, S
    GONDA, S
    APPLIED PHYSICS LETTERS, 1985, 46 (08) : 766 - 768
  • [29] Apparent Schottky Barrier Height of MIS Ni/SiC diodes
    Kaufmann, Ivan R.
    Pereira, Marcelo B.
    Boudinov, Henri I.
    2015 30TH SYMPOSIUM ON MICROELECTRONICS TECHNOLOGY AND DEVICES (SBMICRO), 2015,
  • [30] Characterisation of the high temperature performance of 4H-SiC Schottky barrier diodes
    Blasciuc-Dimitriu, C
    Horsfall, AB
    Vassilevski, KV
    Johnson, CM
    Wright, NG
    O'Neill, AG
    SILICON CARBIDE AND RELATED MATERIALS - 2002, 2002, 433-4 : 823 - 826