Fault diagnosis in scan-based BIST

被引：24
|
作者：
Rajski, J [1 ]
Tyszer, J [1 ]
机构：
[1] Mentor Graph Corp, Wilsonville, OR 97070 USA
来源：
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年
关键词：
D O I：
10.1109/TEST.1997.639704
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The paper presents a new fault diagnosis technique for scan-based BIST designs. It can be used for non-adaptive identification of the scan cells that are driven by erroneous signals, irrespective of the error multiplicity. The proposed scheme employs a simple scan cell selection hardware which in conjunction with a conventional signature analysis allows flexible trade-offs between the test application time and the diagnostic resolution.
引用
收藏
页码：894 / 902
页数：9
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