Effect of radiation defects on avalanche breakdown volrage at silicon p-n-junctions

被引:0
|
作者
Korshunov, FP [1 ]
Lastovsky, SB [1 ]
机构
[1] Byelarussian Acad Sci, Inst Solid State & Semicond Phys, Minsk, BELARUS
来源
DOKLADY AKADEMII NAUK BELARUSI | 1999年 / 43卷 / 04期
关键词
D O I
暂无
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Irradiation of Silicon p-n-junctions by electrons with energy 4 MeV increases the avalanche breakdown voltage at room temperature which is caused by decrease of concentration gradient of minor impurities as the result of radiation defects containing basic doping agents.
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页码:44 / 47
页数:4
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