EFFECT OF DU/DT ON AVALANCHE BREAKDOWN OF P-N-JUNCTIONS

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KYUREGYAN, AS

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SOVIET MICROELECTRONICS | 1989年 / 18卷 / 01期

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TM [电工技术]; TN [电子技术、通信技术];

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0808 ; 0809 ;

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页码：38 / 43

页数：6

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