Optimizing Fin Aspect Ratio of Junctionless bulk FinFET for Application in Analog/RF Circuit

被引:0
|
作者
Biswas, Kalyan [1 ]
Sarkar, Chandan Kumar [2 ,3 ]
机构
[1] MCKV Inst Engn, ECE Dept, Howrah, WB, India
[2] Jadavpur Univ, ETCE Dept, Kolkata, W Bengal, India
[3] IIEST Shibpur, Phys Dept, Sibpur, WB, India
关键词
FinFET; Fin aspect ratio; Junctionless MOSFET; Transconductance; Analog/RF Performance; GEOMETRY; PERFORMANCE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
MOSFET devices with multiple gates are well appropriate for low-voltage operation because of its superior performance against Short Channel Effects (SCEs) and better gate controllability. FinFET is considered as one of the promising device. However, Fin geometry has a big impact on its performance. In this paper, an analysis on the effect of Fin structure parameter like Fin aspect ratio (Fin height/Fin width) on the Analog/RF performance of the Junctionless FinFET is presented for its SoC application. Different important output parameters such as OFF current (I-OFF), ON current (I-ON), I-ON/I-OFF current ratio, Transconductance (gm), Transconductance Generation Factor (gm/Ids), Cut-off Frequency (f(T)) and Maximum frequency of oscillation (f(max)) have been analyzed using TCAD device simulator. From the analysis it is established that the device presented in this work shows better I-ON, I-OFF, I-ON/I-OFF, Transconductance, and Transconductance generation factor if Fin structure having higher aspect ratio is used. However, slight decrement in f(T) and f(max) are noticed when the Fin aspect ratio is high. Findings of this work will be helpful for design of devices for its specific applications.
引用
收藏
页码:591 / 595
页数:5
相关论文
共 50 条
  • [31] Analog/RF performance analysis of channel engineered high-K gate-stack based junctionless Trigate-FinFET
    Tayal, Shubham
    Nandi, Ashutosh
    SUPERLATTICES AND MICROSTRUCTURES, 2017, 112 : 287 - 295
  • [32] Analog and RF Performance Evaluation of Junctionless Accumulation Mode (JAM) Gate Stack Gate All Around (GS-GAA) FinFET
    Kumar, Bhavya
    Chaujar, Rishu
    SILICON, 2021, 13 (03) : 919 - 927
  • [33] Analog and RF Performance Evaluation of Junctionless Accumulation Mode (JAM) Gate Stack Gate All Around (GS-GAA) FinFET
    Bhavya Kumar
    Rishu Chaujar
    Silicon, 2021, 13 : 919 - 927
  • [34] Impact of Aspect Ratio and Interface Trap Charge on the Performances of Junctionless MOSFET-Based Adiabatic Logic Circuit
    Ganguli, Tanushree
    Chanda, Manash
    Sarkar, Angsuman
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (12) : 6157 - 6162
  • [35] Impact of Doping Density on Junctionless Gate Stack FD-SOI MOSFET for Analog/RF Application
    Singh, Jyotsana
    Yadava, Narendra
    Chauhan, R. K.
    2019 IEEE 5TH INTERNATIONAL CONFERENCE FOR CONVERGENCE IN TECHNOLOGY (I2CT), 2019,
  • [36] Performance Analysis of Resonant-Fin Transistors and Their Application in RF-Circuit Design
    Hudeczek, Richard
    Hager, Ehrentraud
    Baumgartner, Peter
    Pretl, Harald
    IEEE Access, 2022, 10 : 64388 - 64407
  • [37] Performance Analysis of Resonant-Fin Transistors and Their Application in RF-Circuit Design
    Hudeczek, Richard
    Hager, Ehrentraud
    Baumgartner, Peter
    Pretl, Harald
    IEEE ACCESS, 2022, 10 : 64388 - 64407
  • [38] Design insights into a junctionless nanosheet FET (JL-NSFET) for switching and Analog/RF applications: Device to circuit level assessment
    Bheemudu, Vadthya
    Vaithiyanathan, Dhandapani
    Kaur, Baljit
    MICROELECTRONICS JOURNAL, 2024, 149
  • [39] Application of the Transient Heat Transfer Measurement Technique in a Low Aspect Ratio Pin Fin Cooling Channel
    Axtmann, Meriam
    von Wolfersdorf, Jens
    Meyer, Georg
    JOURNAL OF TURBOMACHINERY-TRANSACTIONS OF THE ASME, 2015, 137 (12):
  • [40] APPLICATION OF THE TRANSIENT HEAT TRANSFER MEASUREMENT TECHNIQUE IN A LOW ASPECT RATIO PIN FIN COOLING CHANNEL
    Axtmann, Meriam
    von Wolfersdorf, Jens
    Meyer, Georg
    ASME TURBO EXPO: TURBINE TECHNICAL CONFERENCE AND EXPOSITION, 2015, VOL 5A, 2015,