Formation of porous layers with different morphologies during anodic etching of n-InP

被引:0
|
作者
Langa, S [1 ]
Tiginyanu, IM
Carstensen, J
Christophersen, M
Föll, H
机构
[1] Univ Kiel, Fac Engn, D-24143 Kiel, Germany
[2] Tech Univ Moldova, Inst Phys Appl, Lab Low Dimens Semicond Struct, Kishinev 2004, Moldova
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Two different morphologies of porous layers were observed in (100)-oriented n-InP anodically etched in an aqueous solution of HCl. At high current density (60 mA/cm(2)) anodization leads to the formation of so-called current-line oriented pores. When the current density decreased to values lower than 5 mA/cm(2) the morphology of the porous layers sharply changed and the pores began to grow along definite <111> crystallographic directions. (C) 2000 The Electrochemical Society. S1099-0062(00)06-078-8. All rights reserved.
引用
收藏
页码:514 / 516
页数:3
相关论文
共 50 条
  • [41] NO2 detection by a resistive device based on n-InP epitaxial layers
    Talazac, L
    Blanc, JP
    Germain, JP
    Pauly, A
    SENSORS AND ACTUATORS B-CHEMICAL, 1999, 59 (2-3) : 89 - 93
  • [42] PREPARATION OF N-INP AND P-INP FILMS BY PH3 TREATMENT OF ELECTRODEPOSITED IN LAYERS
    CATTARIN, S
    MUSIANI, M
    CASELLATO, U
    ROSSETO, G
    RAZZINI, G
    DECKER, F
    SCROSATI, B
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (04) : 1267 - 1272
  • [43] KINETICS AND MECHANISM OF THE ELECTROCHEMICAL FORMATION OF POROUS SURFACE LAYERS ON SILICON IN HYDROFLUORIC ACID. PHOTOELECTROCHEMICAL BEHAVIOR OF n-TYPE SILICON DURING ANODIC FORMATION OF THE POROUS LAYERS.
    Izidinov, S.O.
    Blokhina, A.P.
    Martynova, T.S.
    Soviet electrochemistry, 1986, 23 (03): : 313 - 319
  • [44] HOLOGRAPHIC PHOTOELECTROCHEMICAL ETCHING OF DIFFRACTION GRATINGS IN N-INP AND N-GALNASP FOR DISTRIBUTED FEEDBACK LASERS
    LUM, RM
    GLASS, AM
    OSTERMAYER, FW
    KOHL, PA
    BALLMAN, AA
    LOGAN, RA
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (01) : 39 - 44
  • [45] Formation mechanism of chained and crystallographically oriented pores on n-InP surfaces
    Suchikova, Yana
    Bohdanov, Ihor
    Kovachov, Sergii
    Lazarenko, Andriy
    Popov, Aleksandr A.
    Tsebriienko, Tamara
    Karipbayev, Zhakyp
    Popov, Anatoli I.
    Applied Nanoscience (Switzerland), 2024, 14 (01): : 231 - 239
  • [46] Pore formation on n-InP(100) in acidic liquid ammonia at 223 K -: A true water-free etching process
    Goncalves, A. -M.
    Santinacci, L.
    Eb, A.
    Gerard, I.
    Mathieu, C.
    Etcheberry, A.
    ELECTROCHEMICAL AND SOLID STATE LETTERS, 2007, 10 (04) : D35 - D37
  • [48] Study of a thin anodic oxide on n-InP by photocurrent transient, capacitance measurements and surface analysis
    Simon, N
    Gerard, I
    Mathieu, C
    Etcheberry, A
    ELECTROCHIMICA ACTA, 2002, 47 (16) : 2625 - 2631
  • [50] MORPHOLOGIES AND PHOTOLUMINESCENCE OF POROUS SILICON UNDER DIFFERENT ETCHING AND OXIDATION CONDITIONS
    LIN, CH
    LEE, SC
    CHEN, YF
    JOURNAL OF APPLIED PHYSICS, 1994, 75 (12) : 7728 - 7736