Formation of porous layers with different morphologies during anodic etching of n-InP

被引:0
|
作者
Langa, S [1 ]
Tiginyanu, IM
Carstensen, J
Christophersen, M
Föll, H
机构
[1] Univ Kiel, Fac Engn, D-24143 Kiel, Germany
[2] Tech Univ Moldova, Inst Phys Appl, Lab Low Dimens Semicond Struct, Kishinev 2004, Moldova
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Two different morphologies of porous layers were observed in (100)-oriented n-InP anodically etched in an aqueous solution of HCl. At high current density (60 mA/cm(2)) anodization leads to the formation of so-called current-line oriented pores. When the current density decreased to values lower than 5 mA/cm(2) the morphology of the porous layers sharply changed and the pores began to grow along definite <111> crystallographic directions. (C) 2000 The Electrochemical Society. S1099-0062(00)06-078-8. All rights reserved.
引用
收藏
页码:514 / 516
页数:3
相关论文
共 50 条
  • [21] PHOTOELECTROCHEMICAL ETCHING OF N-INP IN A THIN-FILM CELL
    GREBEL, H
    ISKANDAR, B
    SHEPPARD, KG
    APPLIED PHYSICS LETTERS, 1989, 55 (25) : 2655 - 2657
  • [22] Formation of porous layers on n-GaSb by electrochemical etching
    Borini, S
    Méndez, B
    Piqueras, J
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2004, 19 (07) : 902 - 905
  • [23] Fringe stabilization and depth monitoring during the holographic photoelectrochemical etching of n-InP(100) substrates
    Soltz, D
    DePaoli, MA
    Cescato, L
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (03): : 1784 - 1790
  • [24] DIRECT PHOTOELECTROCHEMICAL ETCHING OF DIFFRACTION GRATINGS IN N-INP AND N-INGAASP
    LUM, RM
    OSTERMAYER, FW
    KOHL, PA
    GLASS, AM
    BALLMAN, AA
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (06) : C218 - C218
  • [25] Fringe stabilization and depth monitoring during the holographic photoelectrochemical etching of n-InP (100) substrates
    Colorado State Univ, Ft. Collins, United States
    Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 1996, 14 (03): : 1784 - 1790
  • [26] Anodic behavior and pore growth of n-InP in acidic liquid ammonia
    Eb, Alexandra
    Goncalves, Anne-Marie
    Santinacci, Lionel
    Mathieu, Charles
    Etcheberry, Arnaud
    COMPTES RENDUS CHIMIE, 2008, 11 (09) : 1023 - 1029
  • [27] NO2 sensitivity of thin n-InP epitaxial layers
    Talazac, L.
    Blanc, J.P.
    Battut, V.
    Mollot, F.
    Electron Technology (Warsaw), 2000, 33 (01): : 213 - 216
  • [28] Electrochemical Formation of Nanoporosity in n-InP Anodes in KOH
    Buckley, D. N.
    O'Dwyer, C.
    Lynch, R. P.
    Quill, N.
    PROCESSES AT THE SEMICONDUCTOR-SOLUTION INTERFACE 4, 2011, 35 (08): : 29 - 48
  • [29] Morphology-to-properties correlations in anodic porous InP layers
    Santinacci, Lionel
    Goncalves, Anne-Marie
    Bouttemy, Muriel
    Etcheberry, Arnaud
    JOURNAL OF SOLID STATE ELECTROCHEMISTRY, 2010, 14 (07) : 1177 - 1184
  • [30] Morphology-to-properties correlations in anodic porous InP layers
    Lionel Santinacci
    Anne-Marie Gonçalves
    Muriel Bouttemy
    Arnaud Etcheberry
    Journal of Solid State Electrochemistry, 2010, 14 : 1177 - 1184