Pore formation on n-InP(100) in acidic liquid ammonia at 223 K -: A true water-free etching process

被引:32
|
作者
Goncalves, A. -M. [1 ]
Santinacci, L.
Eb, A.
Gerard, I.
Mathieu, C.
Etcheberry, A.
机构
[1] Univ Versailles, CNRS, Lavoisier Inst, UMR 8180, F-78035 Versailles, France
[2] Univ Versailles, CNRS, Lavoisier Inst, UMR 8180, F-78035 Versailles, France
关键词
D O I
10.1149/1.2434201
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
For the first time, pore formation on n-InP(100) has been carried out by galvanostatic treatments in acidic liquid ammonia at 223 K. Voltage oscillations correlated to a specific current line oriented pore morphology have been evidenced by scanning electron microscopy. Whatever the anodic charge, a constant pore depth was formed (2-3 mu m). Porous layers have been characterized by ex situ photoluminescence measurements that have revealed a dead layer behavior. This work demonstrates the crucial role of interfacial phenomena illustrated by the use of this uncommon nonaqueous electrolyte. (c) 2007 The Electrochemical Society.
引用
收藏
页码:D35 / D37
页数:3
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