Built-in self test for content addressable memories

被引：0
|
作者：
Kang, YS
Lee, JC
Kang, SH
机构：
来源：
INTERNATIONAL CONFERENCE ON COMPUTER DESIGN - VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS | 1997年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A new parallel test algorithm and a Built-in Self Test(BIST) architecture far an efficient testing of various types of functional faults in Content Addressable Memories(CAMs) are developed. fn test mode, the read operation is replaced by one parallel content addressable search operation and the writing operation is performed parallely with small peripheral circuit modifications. The results show that an efficient and practical testing with very low complexity and area overhead can be achieved.
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页码：48 / 53
页数：6
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