DESIGN FOR TESTABILITY AND BUILT-IN SELF TEST - A REVIEW

被引：22
|
作者：
NAGLE, HT
ROY, SC
HAWKINS, CF
MCNAMER, MG
FRITZEMEIER, RR
机构：
来源：
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | 1989年 / 36卷 / 02期
关键词：
D O I：
10.1109/41.19062
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：129 / 140
页数：12
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