MTJ Degradation in SOT-MRAM by Self-Heating-Induced Diffusion

被引：0
|
作者：
Van Beek, Simon [1 ]
Cai, Kaiming [1 ]
Rao, Siddharth [1 ]
Jayakumar, Ganesh [1 ]
Couet, Sebastien [1 ]
Jossart, Nico [1 ]
Chasin, Adrian [1 ]
Kar, Gouri Sankar [1 ]
机构：
[1] IMEC, Leuven, Belgium
来源：
2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2022年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
4A.2
引用
收藏
页数：1
相关论文
共 47 条
  • [31] Self-heating induced soft degradation of the early voltage in SiGe:C HBTs
    Xu, MW
    Sibaja-Hernandez, A
    Sadovnikov, A
    Decoutere, S
    IEEE ELECTRON DEVICE LETTERS, 2003, 24 (10) : 646 - 648
  • [32] Carrier accumulation enhanced Auger recombination and inner self-heating-induced spectrum fluctuation in CsPbBr3 perovskite nanocrystal light-emitting devices
    Wu, Wenhui
    Zhang, Yumeng
    Liang, Tianyuan
    Fan, Jiyang
    APPLIED PHYSICS LETTERS, 2019, 115 (24)
  • [33] Comparison between trap and self-heating induced mobility degradation in AlGaN/GaN HEMTs
    Kalavagunta, Aditya
    Mukherjee, Shubhajit
    Reed, Robert
    Schrimpf, R. D.
    MICROELECTRONICS RELIABILITY, 2014, 54 (03) : 570 - 574
  • [34] Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET
    Kumar, Vivek
    Sharma, Deepak Kumar
    Dasgupta, Sudeb
    Datta, Arnab
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2025, 72 (03) : 1293 - 1300
  • [35] Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors
    Zhang, Dong
    Wu, Chenfei
    Xu, Weizong
    Ren, Fangfang
    Zhou, Dong
    Yu, Peng
    Zhang, Rong
    Zheng, Youdou
    Lu, Hai
    CHINESE PHYSICS B, 2019, 28 (01)
  • [36] Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors
    张东
    武辰飞
    徐尉宗
    任芳芳
    周东
    于芃
    张荣
    郑有炓
    陆海
    Chinese Physics B, 2019, (01) : 575 - 579
  • [37] Self-Heating-Effect-Induced Degradation Behaviors in a-InGaZnO Thin-Film Transistors
    Hsieh, Tien-Yu
    Chang, Ting-Chang
    Chen, Te-Chih
    Chen, Yu-Te
    Tsai, Ming-Yen
    Chu, Ann-Kuo
    Chung, Yi-Chen
    Ting, Hung-Che
    Chen, Chia-Yu
    IEEE ELECTRON DEVICE LETTERS, 2013, 34 (01) : 63 - 65
  • [38] Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors
    Hsieh, Tien-Yu
    Chang, Ting-Chang
    Chen, Te-Chih
    Tsai, Ming-Yen
    Chen, Yu-Te
    Chung, Yi-Chen
    Ting, Hung-Che
    Chen, Chia-Yu
    APPLIED PHYSICS LETTERS, 2012, 100 (23)
  • [39] Degradation of capacitance-voltage characteristics induced by self-heating effect in poly-si TFTs
    Tai, YH
    Huang, SC
    Chiu, HL
    ELECTROCHEMICAL AND SOLID STATE LETTERS, 2006, 9 (06) : G208 - G210
  • [40] Self-Heating Effect Induced NBTI Degradation in Poly-Si TFTs under Dynamic Stress
    Weng, Chi-Feng
    Chang, Ting-Chang
    Hsieh, Han-Po
    Chen, Shih-Ching
    Hsu, Wei-Che
    Kuo, Wang-Chuang
    Young, Tai-Fa
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2008, 155 (12) : H967 - H970
12345