MTJ Degradation in SOT-MRAM by Self-Heating-Induced Diffusion

被引：0

作者：

Van Beek, Simon ^{[1
]}

Cai, Kaiming ^{[1
]}

Rao, Siddharth ^{[1
]}

Jayakumar, Ganesh ^{[1
]}

Couet, Sebastien ^{[1
]}

Jossart, Nico ^{[1
]}

Chasin, Adrian ^{[1
]}

Kar, Gouri Sankar ^{[1
]}

机构：

[1] IMEC, Leuven, Belgium

来源：

2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2022年

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

4A.2

引用

页数：1

共 47 条

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[44] Impact of Hot-Carrier Degradation on Drain-Induced Barrier Lowering in Multifin SOI n-Channel FinFETs With Self-Heating
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[46] Heating-Induced Performance Degradation of REBa2Cu3O7-x Coated Conductors: An Oxygen Out-Diffusion Scenario with Two Activation Energies
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