MTJ Degradation in SOT-MRAM by Self-Heating-Induced Diffusion

被引：0
|
作者：
Van Beek, Simon [1 ]
Cai, Kaiming [1 ]
Rao, Siddharth [1 ]
Jayakumar, Ganesh [1 ]
Couet, Sebastien [1 ]
Jossart, Nico [1 ]
Chasin, Adrian [1 ]
Kar, Gouri Sankar [1 ]
机构：
[1] IMEC, Leuven, Belgium
来源：
2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2022年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
4A.2
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页数：1
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