A low-cost input vector monitoring concurrent BIST Scheme

被引：0

作者：

Voyiatzis, I. ^{[1
]}

Efstathiou, C. ^{[1
]}

Sgouropoulou, C. ^{[1
]}

机构：

[1] Technol Educ Inst Athens, Athens, Greece

来源：

PROCEEDINGS OF THE 2013 IEEE 19TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) | 2013年

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Input vector monitoring concurrent BIST schemes perform testing concurrently with the operation of the circuit. In this work a novel input vector monitoring concurrent BIST scheme is presented that compares favorably to previously proposed schemes with respect to the required hardware overhead.

引用

页码：179 / 180

页数：2

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