A low-cost input vector monitoring concurrent BIST Scheme

被引：0
|
作者：
Voyiatzis, I. [1 ]
Efstathiou, C. [1 ]
Sgouropoulou, C. [1 ]
机构：
[1] Technol Educ Inst Athens, Athens, Greece
来源：
PROCEEDINGS OF THE 2013 IEEE 19TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) | 2013年
关键词：
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
Input vector monitoring concurrent BIST schemes perform testing concurrently with the operation of the circuit. In this work a novel input vector monitoring concurrent BIST scheme is presented that compares favorably to previously proposed schemes with respect to the required hardware overhead.
引用
收藏
页码：179 / 180
页数：2
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