SiGe HBT BiCMOS technology for millimeter-wave applications

被引:1
|
作者
Joseph, A [1 ]
Dahlstrom, M
Liu, QH
Orner, B
Liu, XF
Sheridan, D
Rassell, R
Dunn, J
Ahlgren, D
机构
[1] IBM Corp, Semicond Res & Dev Ctr, Essex Jct, VT 05452 USA
[2] Hopewell Junct, Bridgeport, NY 12590 USA
关键词
D O I
10.1002/pssc.200564170
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present the advances in Silicon Germanium Heterojunction Bipolar Transistor (SiGe HBT) and BiCMOS technology capabilities to address the emerging millimetre-wave (mmWave) applications. SiGe HBTs with f(MAX) performance reaching 350 GHz that are integrated with advanced CMOS and high-frequency passives is envisioned to allow better integration capability for mmWave applications. This capability of SiGe HBT BiCMOS technology is discussed relative to an InP HBT technology. (c) 2006 WILEY-VCH Verlag GmbH & Co KGaA, Weinheim.
引用
收藏
页码:448 / +
页数:2
相关论文
共 50 条
  • [1] A BiCMOS technology featuring a 300/330 GHz (fT/fmax)SiGe HBT for millimeter wave applications
    Orner, B. A.
    Dahlstrom, M.
    Pothiawala, A.
    Rassel, R. M.
    Liu, Q.
    Ding, H.
    Khater, M.
    Ahlgren, D.
    Joseph, A.
    Dunn, J.
    [J]. PROCEEDINGS OF THE 2006 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 2006, : 49 - +
  • [2] SiGe technology requirements for millimeter-wave applications
    Wennekers, P
    Reuter, R
    [J]. PROCEEDING OF THE 2004 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 2004, : 79 - 83
  • [3] SiGe HBTs and BiCMOS Technology for Present and Future Millimeter-Wave Systems
    Zimmer, Thomas
    Boeck, Josef
    Buchali, Fred
    Chevalier, Pascal
    Collisi, Michael
    Debaillie, Bjorn
    Deng, Marina
    Ferrari, Philippe
    Fregonese, Sebastien
    Gaquiere, Christophe
    Ghanem, Haitham
    Hettrich, Horst
    Karakuzulu, Alper
    Maiwald, Tim
    Margalef-Rovira, Marc
    Maye, Caroline
    Moeller, Michael
    Mukherjee, Anindya
    Ruecker, Holger
    Sakalas, Paulius
    Schmid, Rolf
    Schneider, Karina
    Schuh, Karsten
    Templ, Wolfgang
    Visweswaran, Akshay
    Zwick, Thomas
    [J]. IEEE JOURNAL OF MICROWAVES, 2021, 1 (01): : 288 - 298
  • [4] Portable Terahertz/Millimeter-Wave Spectrometer Based on SiGe BiCMOS Technology for Gas Sensing Applications
    Rothbart, Nick
    Schmalz, Klaus
    Huebers, Heinz-Wilhelm
    [J]. 2020 45TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2020,
  • [5] Millimeter-wave Beamforming Circuits in SiGe BiCMOS
    Elkhouly, Mohamed
    Choi, Chang-Soon
    Glisic, Srdjan
    Scheytt, Christoph
    Ellinger, Frank
    [J]. 2010 IEEE BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING (BCTM), 2010, : 129 - 132
  • [6] HBT device robustness against process variations in millimeter-wave BiCMOS technology
    Avenier, G.
    Chevalier, P.
    Montagne, A.
    Parmigiani, L.
    Berthier, L.
    Renault, O.
    Oghdayan, E.
    Mathieu, M.
    Campidelli, Y.
    Dutartre, D.
    Chantre, A.
    [J]. 2012 IEEE BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING (BCTM), 2012,
  • [7] Millimeter-wave amplifiers using a 0.8 μm Si/SiGe HBT technology
    Chaitier, S
    Sönmez, E
    Schumacher, H
    [J]. 2006 TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS, DIGEST OF PAPERS, 2006, : 277 - +
  • [8] Millimeter-Wave Amplifier-Based Noise Sources in SiGe BiCMOS Technology
    Forsten, Henrik
    Saijets, Jan H.
    Kantanen, Mikko
    Varonen, Mikko
    Kaynak, Mehmet
    Piironen, Petri
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2021, 69 (11) : 4689 - 4696
  • [9] Sensitive Millimeter-Wave/Terahertz Gas Spectroscopy Based on SiGe BiCMOS Technology
    Kissinger, D.
    Rothbart, N.
    Schmalz, K.
    Borngraeber, J.
    Huebers, H. -W.
    [J]. 2018 43RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2018,
  • [10] Millimeter-Wave and Terahertz Transceivers in SiGe BiCMOS Technologies
    Kissinger, Dietmar
    Kahmen, Gerhard
    Weigel, Robert
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2021, 69 (10) : 4541 - 4560