Alignability equivalence of synchronous sequential circuits

被引:2
|
作者
Rosenmann, A [1 ]
Hanna, Z [1 ]
机构
[1] Intel, IDC, Log & Validat Technol Design Technol Div, Haifa, Israel
关键词
D O I
10.1109/HLDVT.2002.1224438
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Sequential verification is a well known research framework that has attracted many researchers in the academic and industrial worlds during the last few decades. In this framework, initialization of synchronous models is one of the fundamental and challenging research topics that is difficult to solve, especially when talking about large industrial strengths hardware models. Many researchers in this domain such as [10] [8] [9] and others tried to analyze and propose solutions to this problem, however the majority of the,approaches used were based on BDDs and classical reachability analysis methods, which by nature suffer from capacity and complexity limits. When talking about hardware formal, equivalence verification, the initialization issue becomes even more complex especially when trying to verify the logic equivalence of two large industrial circuits. In this note we propose a new adaptive and iterative approach that combines various symbolic simulation techniques and bounded model checking algorithms to initialize sequential circuits for the alignability equivalence verification. The novelty of our method has been employed on complex real life sequential models from Intel lead Pentium processor designs. These methods are already implemented in Intel's sequential verification engine, Insight.
引用
收藏
页码:111 / 114
页数:4
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