Design of delay-verifiable combinational logic by adding extra inputs

被引:0
|
作者
Yu, XM
Min, YH
机构
关键词
delay testing; design for testability; robust delay testable; validatable non-robust testable; delay-verifiable;
D O I
10.1109/ATS.1997.643979
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Correct operation of logic circuits requires not only the functional correctness, but also the correctness of temporal behavior. This paper deals with the problem of delay testability of two-level circuits through adding extra inputs. A design of delay-verifiable combinational logic by adding extra inputs is proposed, and a synthesis procedure is given. Experimental results show that the hardware overhead is about 1/3 of that of the methods proposed in [2],[3], which aim at robust testable or VNR testable circuits. In fact, it is good enough to guarantee delay verifiability to satisfy the requirement of temporal correctness.
引用
收藏
页码:332 / 336
页数:5
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