A Progressive Performance Boosting Strategy for 3-D Charge-Trap NAND Flash

被引:6
|
作者
Chen, Shuo-Han [1 ]
Chen, Yen-Ting [2 ]
Chang, Yuan-Hao [1 ]
Wei, Hsin-Wen [3 ]
Shih, Wei-Kuan [2 ]
机构
[1] Acad Sinica, Inst Informat Sci, Taipei 115, Taiwan
[2] Natl Tsing Hua Univ, Dept Comp Sci, Hsinchu 300, Taiwan
[3] Tamkang Univ, Dept Elect Engn, New Taipei 251, Taiwan
关键词
3-D NAND flash; charge-trap; flash storage; hot/cold identification; performance; MEMORY; STORAGE; DEVICES;
D O I
10.1109/TVLSI.2018.2856080
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The growing demands of large-capacity flash-based storages have facilitated the downscaling process of NAND flash memory. However, the downscaling of traditional planar floating-gate flash memory faces several challenges. Therefore, new NAND flash technologies have been explored to provide larger capacity with low cost. Among these new technologies, the 3-D charge-trap flash is regarded as one of the most promising candidates. The 3-D charge-trap flash is composed of several gate-stack layers and vertical cylindrical channels to provide high-density and low cell-to-cell interference. Owing to the cylindrical geometry of vertical channels, the access performance of each page in one block is distinctive, and this situation is exacerbated in the 3-D charge-trap flash with the fast-growing number of gate-stack layers. In this paper, a progressive performance boosting strategy is proposed to boost the performance of 3-D charge-trap flash by utilizing its asymmetric page access speed feature. A series of experiments was conducted to demonstrate the capability of the proposed strategy on improving the access performance of 3-D charge-trap flash.
引用
收藏
页码:2322 / 2334
页数:13
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