Automated Testing of Mixed-Signal Integrated Circuits by Topology Modification

被引：0

作者：

Coyette, Anthony ^{[1
]}

Esen, Baris ^{[1
]}

Vanhooren, Ronny ^{[1
]}

Dobbelaere, Wim ^{[1
]}

Gielen, Georges ^{[1
]}

机构：

[1] Katholieke Univ Leuven, Dept Elect Engn, Kasteelpk Arenberg 10, B-3001 Leuven, Belgium

来源：

2015 IEEE 33RD VLSI TEST SYMPOSIUM (VTS) | 2015年

关键词：

Design-for-Testability; controllability; observability; low-overhead; co-optimization; ANALOG;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A general method is proposed to automatically generate a DfT solution aiming at the detection of catastrophic faults in analog and mixed-signal integrated circuits. The approach consists in modifying the topology of the circuit by pulling up (down) nodes and then probing differentiating node voltages. The method generates a set of optimal hardware implementations addressing the multi-objective problem such that the fault coverage is maximized and the silicon overhead is minimized. The new method was applied to a real-case industrial circuit, demonstrating a nearly 100 percent coverage at the expense of an area increase of about 5 percent.

引用

页数：6

共 50 条

[21] MEASUREMENT OF DIGITAL NOISE IN MIXED-SIGNAL INTEGRATED-CIRCUITS
MAKIEFUKUDA, K
KIKUCHI, T
MATSUURA, T
HOTTA, M
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1995, 30 (02) : 87 - 92
[22] Software enhances design of analog/mixed-signal integrated circuits
Moretti, G
EDN, 2001, 46 (04) : 26 - 26
[23] Making complex mixed-signal telecommunication integrated circuits testable
Roberts, GW
Dufort, B
IEEE COMMUNICATIONS MAGAZINE, 1999, 37 (06) : 90 - 96
[24] Implementation of CMOS fuzzy controllers as mixed-signal integrated circuits
Baturone, I
SanchezSolano, S
Barriga, A
Huertas, JL
IEEE TRANSACTIONS ON FUZZY SYSTEMS, 1997, 5 (01) : 1 - 19
[25] Concurrent error detection in analog and mixed-signal integrated circuits
Lubaszewski, M
Mir, S
Rueda, A
Huertas, JL
38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2, 1996, : 1151 - 1156
[26] DESIGN-FOR-TESTABILITY AUTOMATION OF MIXED-SIGNAL INTEGRATED CIRCUITS
Mosin, Sergey
2013 IEEE 26TH INTERNATIONAL SOC CONFERENCE (SOCC), 2013, : 244 - 249
[27] Operational Calibration of Mixed-Signal Integrated Circuits in Hostile Environments
Wilson, Peter R.
Wilcock, Reuben
2009 IEEE AEROSPACE CONFERENCE, VOLS 1-7, 2009, : 2117 - 2123
[28] Testing Technologies for Analog/Mixed-Signal Circuits in IoT Era
Kobayashi H.
Kuwana A.
Wei J.
Tsukiji N.
Zhao Y.
IEEJ Transactions on Electronics, Information and Systems, 2021, 141 (01) : 1 - 12
[29] An approach to the classification of mixed-signal circuits in a pseudorandom testing scheme
Corsi, F
Marzocca, C
Matarrese, G
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS, 2003, : 1178 - 1179
[30] Low cost test architecture for mixed-signal integrated circuits
da Silva, Julio L., Jr.
Camargo, Emerson
Foster, Douglas
Coelho, Sandro T.
de Oliveira, Antonio G.
Olmos, Alfredo
Lubaszewski, Marcelo
2014 19TH INTERNATIONAL MIXED-SIGNALS, SENSORS AND SYSTEMS TEST WORKSHOP (IMS3TW), 2014,

← 1 2 3 4 5 →