MEASUREMENT OF DIGITAL NOISE IN MIXED-SIGNAL INTEGRATED-CIRCUITS

被引：21
|
作者：
MAKIEFUKUDA, K [1 ]
KIKUCHI, T [1 ]
MATSUURA, T [1 ]
HOTTA, M [1 ]
机构：
[1] HITACHI LTD,DIV SEMICOND & INTEGRATED CIRCUITS,KOKUBUNJI,TOKYO 185,JAPAN
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1995年 / 30卷 / 02期
关键词：
D O I：
10.1109/4.341734
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper proposes a method of measuring the influence of digital noise on analog circuits using wide-band voltage comparators as noise detectors. Noise amplitude and rms voltage are successfully measured by this method. A test chip is fabricated to measure the digital noise influence. From the experimental results, it is shown that the digital noise influence can be considerably reduced by using a differential configuration in analog circuits for mixed-signal IC's. The digital noise influence can be further reduced by lowering the digital supply voltage. These results show that the voltage-comparator-based measuring method is effective in measuring the influence of digital noise on analog circuits.
引用
收藏
页码：87 / 92
页数：6
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