共 50 条
- [41] Simulation of surface engineering for ultra shallow junction formation of PMOS for the 90nm CMOS technology node and beyond [J]. 2003 IEEE INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, 2003, : 155 - 158
- [42] A Single-Inductor Dual-Output Pseudo-DCM/CCM Buck and Boost Converter in 90nm CMOS Technology [J]. 2008 9TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, VOLS 1-4, 2008, : 1929 - 1932
- [43] System-level Simulation and Analysis of a WiMAX Direct-conversion Receiver in 90nm CMOS [J]. TENCON 2010: 2010 IEEE REGION 10 CONFERENCE, 2010, : 1129 - 1134
- [44] Electrical characterization by sub-micron probing technique on 90nm CMOS technology for failure analysis [J]. IPFA 2004: PROCEEDINGS OF THE 11TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2004, : 271 - 274
- [45] Design, Simulation and Analysis of Energy Efficient 1-Bit Full Adder at 90nm CMOS Technology for Deep Submicron Levels [J]. 2016 IEEE INTERNATIONAL CONFERENCE ON COMPUTING, COMMUNICATION AND AUTOMATION (ICCCA), 2016, : 1444 - 1449
- [47] Development of 90nm InGaAs HEMTs and Benchmarking Logic Performance with Si CMOS [J]. 2010 IEEE COMPOUND SEMICONDUCTOR INTEGRATED CIRCUIT SYMPOSIUM (CSICS), 2010,
- [48] A 20GSps Track-and-Hold Circuit in 90nm CMOS Technology [J]. 2012 INTERNATIONAL CONFERENCE ON ADVANCED TECHNOLOGIES FOR COMMUNICATIONS (ATC 2012), 2012, : 237 - 240
- [49] Efficiency of Oscillation-based BIST in 90nm CMOS Active Analog Filters [J]. PROCEEDINGS OF THE 2013 IEEE 16TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), 2013, : 263 - 266
- [50] Characterization and model enablement of high-frequency noise in 90nm CMOS technology [J]. NOISE AND FLUCTUATIONS IN CIRCUITS, DEVICES, AND MATERIALS, 2007, 6600