Efficiency of Oscillation-based BIST in 90nm CMOS Active Analog Filters

被引：0

作者：

Arbet, Daniel ^{[1
]}

Nagy, Gabriel ^{[1
]}

Stopjakova, Viera ^{[1
]}

Gyepes, Gabor ^{[1
]}

机构：

[1] Slovak Univ Technol Bratislava, Inst Elect & Photon, Fac Elect Engn & Informat Technol, Bratislava, Slovakia

来源：

PROCEEDINGS OF THE 2013 IEEE 16TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS) | 2013年

关键词：

mixed-signal test; Oscillation-based BIST; parametric test; fault detection; catastrophic and parametric faults; technology variations;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Research presented in this paper is aimed at the comparison of the Oscillation-based Built-In Self Test (OBIST) efficiency in covering catastrophic and parametric faults in active analog integrated filters designed in two different technologies. Sallen-Key topologies of low-pass and high-pass filters were used as Circuit Under Test (CUT), designed in 0.35 mu m and 90nm CMOS technologies. The presented oscillation test strategy uses the on-chip Schmitt oscillator as the reference frequency source to compensate the influence of process parameter variations. Achieved results show that the proposed BIST approach is fully implementable in nanoscale technologies. Finally, dependence of the fault coverage on the oscillation frequency value was investigated.

引用

页码：263 / 266

页数：4

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