A novel oscillation-based BIST for ADCs

An oscillation based BIST scheme for ADCs was proposed. A novel technique was used to timing output codes of ADCs by digital mode. In the BIST structure, the test signal was controlled by the feedback circuit to oscillate between two transition edges of ADCs. The rising and failing time of the test signal during oscillation period was in direct proportion to the code width of ADCs under testing. By timing the rising or falling time and comparing it with an ideal time, the offset error, Differential Non-Linearity (DNL), Integral Non-Linearity (INL) and gain error can be achieved.