Oscillation-based Built-In Self Test of Integrated Active Analog Filters

被引：0

作者：

Arbet, Daniel ^{[1
]}

Brenkus, Juraj ^{[1
]}

Majer, Libor ^{[1
]}

Stopjakova, Viera ^{[1
]}

机构：

[1] Slovak Univ Technol Bratislava, Dept IC Design & Test, Fac Elect Engn & Informat Technol, Bratislava, Slovakia

来源：

2011 INTERNATIONAL CONFERENCE ON APPLIED ELECTRONICS (AE) | 2011年

关键词：

TEST METHODOLOGY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new strategy for Oscillation-based Built-In Self Test (OBIST) of active analog filters, applicable for either a whole chip or a part of complex analog and mixed-signal systems, is described. In the test mode, a Circuit Under Test (CUT) is transformed to an oscillator, and the oscillation frequency is then compared to a reference frequency. In our approach, the reference frequency is given by the Schmitt trigger oscillator, which has been realized on-chip to compensate technology variations.

引用

页数：4

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