Triple-probe atomic force microscope: Measuring a carbon nanotube/DNA MIS-FET

被引：0

作者：

Shimotani, K ^{[1
]}

Watanabe, H ^{[1
]}

Manabe, C ^{[1
]}

Shigematsu, T ^{[1
]}

Shimizu, M ^{[1
]}

机构：

[1] Fuji Xerox Co Ltd, Corp Res Lab, Ecol Res Lab, Kanagawa 2590157, Japan

来源：

SPATIALLY RESOLVED CHARACTERIZATION OF LOCAL PHENOMENA IN MATERIALS AND NANOSTRUCTURES | 2003年 / 738卷

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have constructed an advanced electric probing system, which is a triple-probe atomic force microscope (T-AFM). The T-AFM consists of "Nanotweezers" and an AFM with a carbon nanotube probe. Using this system, we fabricated a single-walled carbon nanotubes (SWNTs)/deoxyribonucleic acid (DNA) three-terminal device and measured the current-voltage (I-V) curves of this device. In this three-terminal device, DNA strands were entangled with the SWNT bundle, and behaved as a gate-insulator-layer. This three-terminal device worked as a metal-insulator-semiconductor field effect transistor (MIS-FET) with depletion switching behavior.

引用

页码：289 / 292

页数：4

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