Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam

被引：73

作者：

Martinez, J ^{[1
]}

Yuzvinsky, TD

Fennimore, AM

Zettl, A

García, R

Bustamante, C

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Sci Mat, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[3] CSIC, Inst Microelect, Madrid 28760, Spain

来源：

NANOTECHNOLOGY | 2005年 / 16卷 / 11期

关键词：

D O I：

10.1088/0957-4484/16/11/004

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We report on the precise positioning of a carbon nanotube on an atomic force microscope (AFM) tip. By using a nanomanipulator inside a scanning electron microscope, an individual nanotube was retrieved from a metal foil by the AFM tip. The electron beam allows us to control the nanotube length and to sharpen its end. The performance of these tips for AFM imaging is demonstrated by improved lateral resolution of DNA molecules.

引用

页码：2493 / 2496

页数：4

共 50 条

[1] Length Control and Sharpening of Carbon Nanotube Scanning Probe Microscope Tips Using Carbon Nanotube "Nanoknife"
Wei, X. L.
Jiang, A. N.
Gao, S.
Chen, Q.
[J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2009, 9 (02) : 1258 - 1262
[2] Carbon nanotube atomic force tips
不详
[J]. CHEMIE INGENIEUR TECHNIK, 2001, 73 (08) : 1050 - 1050
[3] Carbon nanotube tips for atomic force microscopy
Wilson N.R.
MacPherson J.V.
[J]. Nature Nanotechnology, 2009, 4 (8) : 483 - 491
[4] Carbon nanotube tips for atomic force microscopy
Wilson, Neil R.
Macpherson, Julie V.
[J]. NATURE NANOTECHNOLOGY, 2009, 4 (08) : 483 - 491
[5] Carbon nanotube as probe for atomic force microscope
Xu, Z. W.
Liang, Y. C.
Dong, S.
Guo, L. Q.
Sun, T.
Zhao, Q. L.
[J]. ADVANCES IN MACHINING & MANUFACTURING TECHNOLOGY VIII, 2006, 315-316 : 758 - 761
[6] Sharpened electron beam deposited tips for high resolution atomic force microscope lithography and imaging
Wendel, M
Lorenz, H
Kotthaus, JP
[J]. APPLIED PHYSICS LETTERS, 1995, 67 (25) : 3732 - 3734
[7] Electron beam detection of a Nanotube Scanning Force Microscope
Alessandro Siria
Antoine Niguès
[J]. Scientific Reports, 7
[8] Electron beam detection of a Nanotube Scanning Force Microscope
Siria, Alessandro
Nigues, Antoine
[J]. SCIENTIFIC REPORTS, 2017, 7
[9] Imaging artefacts in atomic force microscopy with carbon nanotube tips
Strus, MC
Raman, A
Han, CS
Nguyen, CV
[J]. NANOTECHNOLOGY, 2005, 16 (11) : 2482 - 2492
[10] Using conductive atomic force microscope on carbon nanotube networks
Zhao Hua-Bo
Li Zhen
Li Rui
Zhang Zhao-Hui
Zhang Yan
Liu Yu
Li Yan
[J]. ACTA PHYSICA SINICA, 2009, 58 (12) : 8473 - 8477

← 1 2 3 4 5 →