Carbon nanotube as probe for atomic force microscope

被引：0
|
作者：
Xu, Z. W. [1 ]
Liang, Y. C. [1 ]
Dong, S. [1 ]
Guo, L. Q. [1 ]
Sun, T. [1 ]
Zhao, Q. L. [1 ]
机构：
[1] Harbin Inst Technol, Harbin 50001, Peoples R China
来源：
ADVANCES IN MACHINING & MANUFACTURING TECHNOLOGY VIII | 2006年 / 315-316卷
关键词：
carbon nanotube; probe; fabrication; atomic force microscope; wear;
D O I：
10.4028/www.scientific.net/KEM.315-316.758
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An improved arc welding method was developed to fabricate carbon nanotube probe under direct view of optical microscope. The new fabrication method here needs not coat silicon probe in advance with metal film, which greatly reduces the fabrication's difficulty. An easy method for shortening the nanotube probe was also developed. The improved fabrication method here is simple and reliable. The fabricated carbon nanotube probe showed good properties of higher length-to-diameter aspect ratio, better wear characteristics than silicon probe.
引用
收藏
页码：758 / 761
页数：4
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