Triple-probe atomic force microscope: Measuring a carbon nanotube/DNA MIS-FET

被引：0
|
作者：
Shimotani, K [1 ]
Watanabe, H [1 ]
Manabe, C [1 ]
Shigematsu, T [1 ]
Shimizu, M [1 ]
机构：
[1] Fuji Xerox Co Ltd, Corp Res Lab, Ecol Res Lab, Kanagawa 2590157, Japan
来源：
SPATIALLY RESOLVED CHARACTERIZATION OF LOCAL PHENOMENA IN MATERIALS AND NANOSTRUCTURES | 2003年 / 738卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have constructed an advanced electric probing system, which is a triple-probe atomic force microscope (T-AFM). The T-AFM consists of "Nanotweezers" and an AFM with a carbon nanotube probe. Using this system, we fabricated a single-walled carbon nanotubes (SWNTs)/deoxyribonucleic acid (DNA) three-terminal device and measured the current-voltage (I-V) curves of this device. In this three-terminal device, DNA strands were entangled with the SWNT bundle, and behaved as a gate-insulator-layer. This three-terminal device worked as a metal-insulator-semiconductor field effect transistor (MIS-FET) with depletion switching behavior.
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页码：289 / 292
页数：4
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