Analysis of Reliability Test Results for CMDS LSI and VLSI Circuits

被引：0
|
作者：
Petrukhin, B. P. [1 ]
Shavykin, N. A. [1 ]
机构：
[1] Russian Acad Sci, Trapeznikov Inst Control Sci, Moscow, Russia
来源：
AUTOMATION AND REMOTE CONTROL | 2011年 / 72卷 / 02期
关键词：
Cyclone; Failure Rate; Remote Control; Crystal Temperature; VLSI Circuit;
D O I：
10.1134/S0005117911020226
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The reliability test results for CMDS LSI and VLSI circuits manufactured by Xilinx and Altera are analyzed. Upper estimates of failure rate with confidence probability P = 0.9 are obtained for all types of digital chips supplied by these companies.
引用
收藏
页码：449 / 455
页数：7
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