QUALITY ASSURANCE SYSTEM AND RELIABILITY TESTING OF LSI CIRCUITS

被引：2

|

作者：

WURNIK, FM

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1983年 / 23卷 / 04期

关键词：

D O I：

10.1016/0026-2714(83)91159-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：709 / 715

页数：7

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