Analysis of Reliability Test Results for CMDS LSI and VLSI Circuits

被引：0

作者：

Petrukhin, B. P. ^{[1
]}

Shavykin, N. A. ^{[1
]}

机构：

[1] Russian Acad Sci, Trapeznikov Inst Control Sci, Moscow, Russia

来源：

AUTOMATION AND REMOTE CONTROL | 2011年 / 72卷 / 02期

关键词：

Cyclone; Failure Rate; Remote Control; Crystal Temperature; VLSI Circuit;

D O I：

10.1134/S0005117911020226

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

The reliability test results for CMDS LSI and VLSI circuits manufactured by Xilinx and Altera are analyzed. Upper estimates of failure rate with confidence probability P = 0.9 are obtained for all types of digital chips supplied by these companies.

引用

页码：449 / 455

页数：7

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