DFT techniques for memory macro with built-in ECC

被引：2

作者：

Kushida, K ^{[1
]}

Otsuka, N ^{[1
]}

Hirabayashi, O ^{[1
]}

Takeyama, Y ^{[1
]}

机构：

[1] Toshiba Co Ltd, SoC Res & Dev Ctr, Kawasaki, Kanagawa, Japan

来源：

2005 IEEE International Workshop on Memory Technology, Design, and Testing - Proceedings | 2005年

关键词：

D O I：

10.1109/MTDT.2005.19

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

DFT techniques to implement ECC circuitry on memory macro with no additional test cost are proposed. New methodology to design a hamming code matrix is used to achieve whole ECC system testing with standard memory BIST and conventional test sequence. The proposed ECC techniques are implemented in a 512Kb SRAM macro and demonstrated by hardware characterization with 90mn technology.

引用

页码：109 / 114

页数：6

共 50 条

[21] Built-in test engine and fault simulation for memory
McEvoy, P
Farrell, R
VLSI Circuits and Systems II, Pts 1 and 2, 2005, 5837 : 742 - 753
[22] Memory built-in self-repair for nanotechnologies
Nicolaidis, M
Achouri, N
Anghel, L
9TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS, 2003, : 94 - 98
[23] On programmable memory built-in self test architectures
Zarrineh, K
Upadhyaya, SJ
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS, 1999, : 708 - 713
[24] Evaluating Built-in ECC of FPGA on-chip Memories for the Mitigation of Undervolting Faults
Salami, Behzad
Unsal, Osman S.
Cristal Kestelman, Adrian
2019 27TH EUROMICRO INTERNATIONAL CONFERENCE ON PARALLEL, DISTRIBUTED AND NETWORK-BASED PROCESSING (PDP), 2019, : 242 - 246
[25] Progressive ECC Techniques for Phase Change Memory
Lu, Shyue-Kung
Li, Hui-Ping
Miyase, Kohei
2018 IEEE 27TH ASIAN TEST SYMPOSIUM (ATS), 2018, : 161 - 166
[26] Built-in self-repair techniques for embedded RAMs
Lu, SK
IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES, 2003, 150 (04): : 201 - 208
[27] Built-in Self-Test and Built-in Self-Repair Strategies Without Golden Signature for Computing in Memory
Tsai, Yu-Chih
Ting, Wen-Chien
Wang, Chia-Chun
Chang, Chia-Cheng
Liu, Ren-Shuo
2023 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE, 2023,
[28] ON BUILT-IN TEST TECHNIQUES IN RELIABLE COMPUTER-SYSTEMS
SOI, IM
AGGARWAL, KK
COMPUTERS & ELECTRICAL ENGINEERING, 1981, 8 (02) : 109 - 114
[29] Efficient Built-In Self-Test algorithm for memory
Wang, SJ
Wei, CJ
PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000), 2000, : 66 - 70
[30] METHOD OF SYNTHESIZING BUILT-IN MONITORING ARRANGEMENTS FOR AUTOMATA WITH MEMORY
AKSENOVA, GP
AUTOMATION AND REMOTE CONTROL, 1973, 34 (02) : 267 - 273

← 1 2 3 4 5 →